Custom‑Developed Software for Film Thickness Analysis Using Optical Interferometry
Investigadores
Fernández-Silva, Samuel David; García-Pérez, María; Roman, Claudia; García-Morales, Moisés; Delgado, Miguel Ángel; Glovnea, Romeo
Actividad
Software de creación propia para la evaluación de espesores de película de lubricante en contactos tribológicos a través del análisis de imágenes obtenidas mediante interferometría óptica (enlace al material)
Resumen
Commercial software typically supports film‑thickness analysis only up to about 250 nm. In contrast, our custom VB.NET–based software enables accurate measurements up to 800 nm. The tool extracts RGB values from interferometric data captured by a CCD camera during SLIM measurements at different entrainment speeds and correlates them with corresponding film‑thickness values obtained from UTFI measurements. The resulting calibration curve is then used to perform detailed film‑profile analysis within the contact region.
The package includes the software, user instructions, and a video tutorial.